wafer.space Run 2

3.3V SRAM test 2

OCD3 · Memory test chip · 1 × ½ slot

Rendered from the layout at 2.5 µm per pixel. Layers: NwellDiffusionPolysiliconMetal 1Metal 2Metal 3Metal 4Metal 5Top metalPad openings

123 logic cells: too few for density figures, which are given for designs of 1,000 or more.

Every figure here is measured from the public layout, the same way for every design on the run: see data and method, and how its designs used the process.

A variant of the 3.3V SRAM test chip submitted for the first shuttle run.

This one has the new 64 byte SRAM block on it, which was designed to (maybe) fit in a single Tiny Tapeout tile.

It also has a new design of a 3.3V power-on-reset (PoR) block.

Die3.93 × 2.53 mm (9.9 mm²)
Core area5.01 mm² inside the pad ring
the project template's, 442 µm in from each edge
Inside the seal ring9.61 mm² (the die less its 26 µm seal ring)
Placements1 on the reticle, in slot C2 OCD3 on the reticle
Bond pads72
Transistors158,397
Logic cells123 + 442 filler and tap cells
Libraries AS 7t-3.3V (123)
SRAM4 macros, 14,848 bits

Submission

LicenceApache-2.0 declared
Repository: Apache-2.0 (in source file headers) — agrees
How it was checked
Commit and PDK pin The licence and template were read from the repository at commit 6d4f6099546c.
Chip-on-boardSelected at submission
PrecheckPassed the check it was accepted on, 2026-07-04
Passed latest re-run, 2026-08-02, gf180mcu-precheck 1.7.3
step results and logs

Process features

Which parts of the GF180MCU process this design uses: its transistor voltages and where they come from, its gate oxides, and any devices drawn by hand outside the standard cells, SRAM and pads.

3.3 VAS 7t-3.3V standard cells, ocd SRAM, 177 custom transistors
Gate oxidesThin only (3.3 V) in the design itself
the pad ring adds thick-oxide (5 V, 6 V) transistors
MIM capacitors40 (4,000 µm², between Metal4 and Metal5)
High-resistance poly resistors200 (5,000 µm²)
Diodes1 (0 µm²)
I/O librarygf180mcu_ocd_io (758 cells)

Where the area went

How this design's area splits between logic cells, SRAM, other and pad ring.

47%
50%
  • Logic cells 0.01 mm² (<1%)
  • SRAM 0.37 mm² (4%)
  • Other 4.64 mm² (47%)
  • Pad ring 4.93 mm² (50%)

Most used cells

The ten standard cells this design uses most.

CellLibraryInstancesWhat it does
buff_12AS 7t-3.3V 106Buffer (12x drive)
mux2_4AS 7t-3.3V 162-input multiplexer (4x drive)
inv_4AS 7t-3.3V 1Inverter (4x drive)

SRAM macros

The ready-made memory blocks this design uses.

3.3V SRAM test 2 has been made on 2 shuttles since Dec 2025. Every version, oldest first, with this one in bold:

  1. Dec 2025 · wafer.space Run 1 OCD2 ocd_sram_test — 1 × ½ slot
  2. Jul 2026 · wafer.space Run 2 OCD3 3.3V SRAM test 2 — 1 × ½ slot

Tiny Tapeout tile Google shuttle wafer.space die

Its dies compared

Every die of this design measured here, oldest first, with this one in bold.

Made onSlotLibraryGate oxides Logic cellsPer mm² of coreDensest SRAM
wafer.space Run 1 · OCD2 1 × ½mixed 3.3 V and 5 V/6 V 122 — — 4 macros
wafer.space Run 2 · OCD3 1 × ½AS 7t-3.3V 3.3 V only 123 — — 4 macros

Precheck

Before a design is made, the wafer.space platform checks it against the foundry's design rules. OCD3 was accepted on this check, and has been checked again since with newer rules.

All 17 steps passed, with 0 KLayout DRC errors, on 2026-07-04.

Every step, and the latest re-run
StepAccepted on
check 342, 2026-07-04, initial
Latest re-run
check 747, 2026-08-02, drc_update, gf180mcu-precheck 1.7.3
PDK open_pdks 1.0.604, LibreLane 5fe3db1
KLayout.ReadLayoutpassedpassed
KLayout.CheckTopLevelpassedpassed
KLayout.CheckSizepassedpassed
KLayout.CheckPadMaskpassedpassed
KLayout.GenerateIDpassedpassed
KLayout.Renderpassedpassed
KLayout.Densitypassedpassed
Checker.KLayoutDensitypassedpassed
KLayout.ZeroAreaPolygonspassedpassed
Checker.KLayoutZeroAreaPolygonspassedpassed
KLayout.Antennapassedpassed
Checker.KLayoutAntennapassedpassed
Magic.DRCpassedpassed
Checker.MagicDRCpassedpassed
KLayout.DRCpassedpassed
Checker.KLayoutDRCpassedpassed
KLayout.WriteLayoutpassedpassed
KLayout DRC errors00
Magic DRC errors (advisory)00
Filessteps · log (gzip)steps · log (gzip)

The steps of the gf180mcu-precheck LibreLane flow, as run by platform.wafer.space. The design was accepted on the newest finished check before it was submitted; later re-runs check the same file with updated rules. KLayout DRC is the sign-off check. Magic DRC is advisory: its count does not stop a design. In the logs, Magic's "Error while reading cell" lines about fill cells are messages from its reader, not check failures.

Want a chip of your own like this one?

wafer.space Run 3 takes orders until 9 December 2026. Or start smaller with Tiny Tapeout: the next Tiny Tapeout GF180MCU chips take projects until 7 December 2026, for wafer.space Run 3.