Rendered from the layout at 2.5 µm per pixel. Layers: NwellDiffusionPolysiliconMetal 1Metal 2Metal 3Metal 4Metal 5Top metalPad openings
| Inside the core logic cells per mm² | 4k
(6% of buffer maximum) over the 12.92 mm² core: what the design itself packed |
|---|---|
| Inside the seal ring logic cells per mm² | 3k
over all 19.65 mm² of the slot, pad ring included |
| Densest mm² logic cells per mm² | 18k (24% of buffer maximum) |
| Core covered by logic | 13% |
| Transistor density transistors per mm² | 156k average, 261k in the mm² with the most logic cells |
Every figure here is measured from the public layout, the same way for every design on the run: see data and method, and how its designs used the process.
eFUSE and SRAM testchip put together by Egorexe and Zedulo team with support from Tillitis
| Die | 3.93 × 5.12 mm (20.1 mm²) |
|---|---|
| Core area | 12.92 mm² inside the pad ring
as set in the design's own layout settings |
| Inside the seal ring | 19.65 mm² (the die less its 26 µm seal ring) |
| Placements | 2 on the reticle, in slots A3, B3 |
| Bond pads | 74 |
| Transistors | 2,014,212 |
| Logic cells | 58,018 + 228,360 filler and tap cells |
| Libraries | 7t-5V (58k) |
| SRAM | 8 macros, 24,064 bits |
| Licence | Apache-2.0 declared
Repository: Apache-2.0 in LICENSE — agrees |
|---|---|
| Template | wafer-space/gf180mcu-project-template 1.3.1 or 1.3.2 |
| How it was checked | Commit and PDK pinThe licence and template were read from the repository at commit 1d1f91d4f362.The template releases named above are the ones whose Makefile pins the same PDK as that commit (PDK_TAG 1.6.4). |
| Chip-on-board | Not selected at submission |
| Precheck | Passed
the check it was accepted on, 2025-12-15
Passed latest re-run, 2026-08-03, gf180mcu-precheck 1.7.3 step results and logs |
Which parts of the GF180MCU process this design uses: its transistor voltages and where they come from, its gate oxides, and any devices drawn by hand outside the standard cells, SRAM and pads.
| 5 V | 7t-5V standard cells, fd SRAM, 47,064 custom transistors |
|---|---|
| 6 V | 44 custom transistors |
| Gate oxides | Thick only (5 V/6 V) in the design itself |
| MIM capacitors | 9
(900 µm², between Metal4 and Metal5)
all in reused simple_por |
| High-resistance poly resistors | 88
(2,200 µm²)
all in reused simple_por |
| eFuses | 2,424 (417,153 µm²) |
| I/O library | gf180mcu_fd_io (1122 cells), gf180mcu_ws_io (18 cells) |
How this design's area splits between logic cells, SRAM, filler and tap cells, other and pad ring.
The ten standard cells this design uses most.
| Cell | Library | Instances | What it does |
|---|---|---|---|
| buf_2 | 7t-5V | 7,472 | Buffer (2x drive) |
| nand2_1 | 7t-5V | 6,591 | 2-input NAND gate |
| dffq_1 | 7t-5V | 4,796 | D flip-flop (1 bit storage) |
| oai21_1 | 7t-5V | 4,150 | OR-AND-Invert compound gate |
| aoi21_1 | 7t-5V | 3,218 | AND-OR-Invert compound gate |
| nor2_1 | 7t-5V | 3,070 | 2-input NOR gate |
| clkinv_1 | 7t-5V | 2,607 | Clock inverter |
| dffrnq_1 | 7t-5V | 2,495 | D flip-flop with reset |
| clkbuf_1 | 7t-5V | 2,331 | Clock buffer |
| mux2_2 | 7t-5V | 2,141 | 2-input multiplexer (2x drive) |
Logic cells per mm² in each square millimetre of the die. Hatched outlines are SRAM macros; the red outline is the densest mm² that avoids them (18k logic cells per mm²), found by sliding a 1 mm square over the die in 0.1 mm steps, so it can straddle the fixed squares and find more than any one of them. Squares at the edges are partial, so they read low.
The ready-made memory blocks this design uses.
| Macro | Count | Bits each |
|---|---|---|
| gf180mcu_fd_ip_sram__sram128x8m8wm1 | 1 | 1,024 |
| gf180mcu_fd_ip_sram__sram256x8m8wm1 | 1 | 2,048 |
| gf180mcu_fd_ip_sram__sram512x8m8wm1 | 5 | 4,096 |
| gf180mcu_fd_ip_sram__sram64x8m8wm1 | 1 | 512 |
Before a design is made, the wafer.space platform checks it against the foundry's design rules. TZ01 was accepted on this check, and has been checked again since with newer rules.
All 15 steps passed, with 0 KLayout DRC errors, on 2025-12-15.
| Step | Accepted on check 105, 2025-12-15, initial | Latest re-run check 774, 2026-08-03, drc_update, gf180mcu-precheck 1.7.3 PDK open_pdks 1.0.604, LibreLane 5fe3db1 |
|---|---|---|
| KLayout.ReadLayout | passed | passed |
| KLayout.CheckTopLevel | passed | passed |
| KLayout.CheckSize | passed | passed |
| KLayout.GenerateID | passed | passed |
| KLayout.Render | not in this flow | passed |
| KLayout.Density | passed | passed |
| Checker.KLayoutDensity | passed | passed |
| KLayout.ZeroAreaPolygons | passed | passed |
| Checker.KLayoutZeroAreaPolygons | passed | passed |
| KLayout.Antenna | passed | passed |
| Checker.KLayoutAntenna | passed | passed |
| Magic.DRC | passed | passed |
| Checker.MagicDRC | passed | passed |
| KLayout.DRC | passed | passed |
| Checker.KLayoutDRC | passed | passed |
| KLayout.WriteLayout | passed | passed |
| KLayout DRC errors | 0 | 0 |
| Magic DRC errors (advisory) | 0 | 0 |
| Files | steps · log (gzip) | steps · log (gzip) |
The steps of the gf180mcu-precheck LibreLane flow, as run by platform.wafer.space. The design was accepted on the newest finished check before it was submitted; later re-runs check the same file with updated rules. KLayout DRC is the sign-off check. Magic DRC is advisory: its count does not stop a design. In the logs, Magic's "Error while reading cell" lines about fill cells are messages from its reader, not check failures.